Change history for SLSPSI - X06DA

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Date/time of ChangeAttributePrevious ValueUpdated Value
2017-02-11 10:45:19 Beamline Website http://www.psi.ch/sls/pxiii/pxiii http://www.psi.ch/sls/pxiii
2017-02-11 10:45:15 Secondary Contact: Name Vincent Olieric Justyna Wojdyla
2017-02-11 10:44:49 Secondary Contact: Email vincent.olieric@psi.ch justyna.wojdyla@psi.ch
2017-02-11 10:44:11 Primary Contact: Email meitian.wang@psi.ch vincent.olieric@psi.ch
2017-02-11 10:44:05 Primary Contact: Name Meitian Wang Vincent Olieric
2017-01-12 04:57:18 %Time Available (general use) 60 70
2017-01-12 04:56:53 Cryo Capability Details fast cooling (5 min)
2017-01-12 04:50:57 Experiments SAD MAD
2017-01-12 04:50:36 Experiments MAD SAD
2017-01-12 04:49:25 Special Capabilities Details Automated in-situ diffraction screening with crystals in various format of crystallization plates Automated in-situ diffraction screening with various SBS crystallization plates format
2017-01-12 04:15:36 Goniometer Details PRIGo
2017-01-12 04:15:32 Goniometer single phi axis, multi-axis goniometer under commissioning (PRIGO) Multi-axis goniometer
2017-01-12 04:14:50 Flux Details at 400 ma at 400 mA
2017-01-12 04:14:19 Special Capabilities In-situ diffraction screening Multi-axis goniometry (PRIGo)
2012-06-13 10:40:30 Detector: Details the new detector is a 2M-F model
2012-06-13 10:40:21 Detector: Model DECTRIS PILATUS 2M DECTRIS PILATUS 2M-F
2012-06-09 08:30:18 Removed from Service: Details replaced by a PILATUS 2M-F
2012-06-09 08:29:59 Detector: Removed from Service 2011-10-31
2011-04-25 11:00:42 Secondary Contact: Email clemens.schulze@psi.ch vincent.olieric@psi.ch
2011-04-25 11:00:30 Secondary Contact: Name Clemens Schulze-Briese Vincent Olieric
2011-04-25 10:59:54 Beamline Website http://sls.web.psi.ch/view.php/beamlines/px3/index.html http://www.psi.ch/sls/pxiii/pxiii
2009-07-31 01:26:00 Special Capabilities Details Automated in-situ diffraction screening with crystals in various format of crystallization plates
2009-07-31 01:24:07 Special Capabilities Microfocus In-situ diffraction screening